5.069 Crystal Structure Analysis
Introduction to X-ray crystallography: symmetry in real and reciprocal space, space and Laue groups, geometry of diffraction, structure factors, phase problem, direct and Patterson methods, electron density maps, structure refinement, crystal growth, powder methods, limits of diffraction methods, structure data bases.
5.069 will be offered this semester (Spring 2019). It is instructed by P. Mueller.
Lecture occurs 8:30 PM to 10:00 AM on Tuesdays and Thursdays in 2-105.
This class counts for a total of 6 credits.
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