3.271 Diffraction and Structure
Describes x-ray and neutron diffraction using Laue equations, Bragg's law, and the reciprocal lattice. Use of Fourier transforms and series to establish relations between intensity and distribution of scattering density. Applications to identification of materials, texture, small angle scattering and Rietveld analysis. Determines structure through diffraction effects: the phase problem, Patterson function, and direct methods for phase determination. Quantitative description and refinement of atomic arrangements.
3.271 will not be offered this semester. It will be instructed by Staff.
This class counts for a total of 12 credits. This is a graduate-level class.
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