3.074 Imaging of Materials


Class Info

Principles and applications of imaging techniques for materials characterization including transmission and scanning electron microscopy and scanning probe microscopy. Topics include electron diffraction; image formation in transmission and scanning electron microscopy; diffraction and phase contrast; imaging of crystals and crystal imperfections; review of the most recent advances in electron microscopy for bio- and nanosciences; analysis of chemical composition and electronic structure at the atomic scale. Lectures, real-case studies and computer simulations.

This class has 3.024 as a prerequisite.

3.074 will not be offered this semester. It will be available in the Spring semester, and will be instructed by S. Gradečak.

This class counts for a total of 12 credits.

You can find more information at the MIT + 3.074 - Google Search site.

MIT 3.074 Imaging of Materials Related Textbooks
MIT 3.074 Imaging of Materials On The Web

© Copyright 2015