3.074 Imaging of Materials
Principles and applications of imaging techniques for materials characterization including transmission and scanning electron microscopy and scanning probe microscopy. Topics include electron diffraction; image formation in transmission and scanning electron microscopy; diffraction and phase contrast; imaging of crystals and crystal imperfections; review of the most recent advances in electron microscopy for bio- and nanosciences; analysis of chemical composition and electronic structure at the atomic scale. Lectures, real-case studies and computer simulations.
This class has 3.024 as a prerequisite.
3.074 will not be offered this semester. It will be instructed by S. Gradečak.
This class counts for a total of 12 credits.
You can find more information at the MIT + 3.074 - Google Search site.
© Copyright 2015 Yasyf Mohamedali