3.074 Imaging of Materials
Principles and applications of imaging techniques for materials characterization including transmission and scanning electron microscopy and scanning probe microscopy. Topics include electron diffraction; image formation in transmission and scanning electron microscopy; diffraction and phase contrast; imaging of crystals and crystal imperfections; review of the most recent advances in electron microscopy for bio- and nanosciences; analysis of chemical composition and electronic structure at the atomic scale. Lectures, real-case studies and computer simulations.
This class has 3.024 as a prerequisite.
This class counts for a total of 12 credits.
You can find more information at the 3.074 Class Site site.
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