3.074 Imaging of Materials

Class Info

Principles and applications of imaging techniques for materials characterization including transmission and scanning electron microscopy and scanning probe microscopy. Topics include electron diffraction; image formation in transmission and scanning electron microscopy; diffraction and phase contrast; imaging of crystals and crystal imperfections; review of the most recent advances in electron microscopy for bio- and nanosciences; analysis of chemical composition and electronic structure at the atomic scale. Lectures, real-case studies and computer simulations.

This class has 3.024 as a prerequisite.

3.074 will not be offered this semester. It will be available in the Spring semester, and will be instructed by S. Gradečak.

Lecture occurs 9:30 AM to 11:00 AM on Tuesdays and Thursdays in 37-212.

This class counts for a total of 12 credits.

You can find more information at the 3.074 Class Site site.

MIT 3.074 Imaging of Materials Related Textbooks
MIT 3.074 Imaging of Materials On The Web

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