2.830 Control of Manufacturing Processes
Statistical modeling and control in manufacturing processes. Use of experimental design and response surface modeling to understand manufacturing process physics. Defect and parametric yield modeling and optimization. Forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.
Lecture occurs 11:00 AM to 12:30 PM on Mondays and Wednesdays in 3-333.
This class counts for a total of 12 credits.
In the Spring 2016 Subject Evaluations, 2.830 was rated 5.5 out of 7.0. You can find more information at the http://www.google.com/search?&q=MIT+%2B+2.830&btnG=Google+Search&inurl=https site or on the 2.830 Stellar site.
© Copyright 2015 Yasyf Mohamedali