12.141 Electron Microprobe Analysis
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and x-ray imaging. Lab sessions involve use of the electron microprobe.
This class has no prerequisites.
12.141 will not be offered this semester. It will be available during IAP.
This class counts for a total of 6 credits.
You can find more information at the http://www.google.com/search?&q=MIT+%2B+12.141&btnG=Google+Search&inurl=https site.
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