12.141 Electron Microprobe Analysis
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and x-ray imaging. Lab sessions involve use of the electron microprobe.
This class has no prerequisites.
12.141 will not be offered this semester. It will be available during IAP.
Lecture occurs 1:00 PM to 5:00 PM on Tuesdays and Thursdays in 54-1221.
This class counts for a total of 6 credits.
You can find more information at the MIT + 12.141 - Google Search site.
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